{"id":9680920379543,"title":"Multifunctional IC Transistor Tester, Integrated Circuit Tester with 5V 3.3V AUTO Modes for Microelectronics Engineers (no Terminal) no terminal","handle":"multifunctional-ic-transistor-tester-integrated-circuit-tester-with-5v-3-3v-auto-modes-for-microelectronics-engineers-no-terminal-no-terminal","description":"\u003ch3\u003eMultifunctional IC Transistor Tester, Integrated Circuit Tester with 5V 3.3V AUTO Modes for Microelectronics Engineers (no Terminal)\u003c\/h3\u003e\n\u003cp id=\"b\"\u003e\u003c\/p\u003e \n\n\u003ch3\u003eProduct Features\u003c\/h3\u003e\n \u003cul class=\"a\"\u003e\n \u003cli\u003eEFFICIENT MEASUREMENT: With more than 1,300 types of built in chip data and more than 420 types of transistor data , covering most common devices within 24 pins, greatly reduce workload and improve work efficiency.\u003c\/li\u003e\n \u003cli\u003eAUTOMATIC SHUTDOWN FUNCTION: The integrated circuit tester will automatically shut down after 60 seconds without any operation. Small and portable design, suitable for circuit testing.\u003c\/li\u003e\n \u003cli\u003eTESTING TYPES: Include logic device test, interface driver device test, op amp, comparison test, transistor identification, voltage regulator voltage value test, optocoupler.\u003c\/li\u003e\n \u003cli\u003eMULTIPLE TEST MODES: Multifunction integrated circuit tester is a professional instrument designed for microelectronics engineers and maintenance personnel. 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Small and portable design, suitable for circuit testing.\u003c\/li\u003e\n \u003cli\u003eTESTING TYPES: Include logic device test, interface driver device test, op amp, comparison test, transistor identification, voltage regulator voltage value test, optocoupler.\u003c\/li\u003e\n \u003cli\u003eMULTIPLE TEST MODES: Multifunction integrated circuit tester is a professional instrument designed for microelectronics engineers and maintenance personnel. Different test modes can be selected, such as 5V mode, 3.3V mode, AUTO mode, etc.\u003c\/li\u003e\n \u003cli\u003eMAIN FUNCTION: Test 74LS series, CD4000 series, HEF400 series, 4500 series, operational amplifiers, interface chips, optocouplers, automatic transistor identification, voltage regulator voltage identification, etc.\u003c\/li\u003e\n \u003c\/ul\u003e"}